Estimation of Soft Error Tolerance according to the Thickness of Buried Oxide and Body Bias 28-nm and 65-nm in FD-SOI Processes by a Monte-Carlo Simulation
نویسندگان
چکیده
1. Abstract We estimate the soft error rates of FD-SOI structures according to the thicknesses of BOX(Buird OXide) layers and body bias on 65-nm and 28-nm processes by reducing the supply voltage. A Monte-Carlo based simulation is used in this work. The parasitic bipolar effect is suppressed by thicker BOX on FD-SOI structure.The simulation results are consistent with the alpha and neutron irradiation measurement results. We will show the SERs of FD-SOI structures according to the body bias in the final paper.
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